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Silicon Wafer Defect Detection

Silicon Wafer Defect Detection
Inspection Requirement: Detection of slurry leakage in silicon wafers, with an accuracy requirement of 0.04mm/pixel and a field of view of 130mm x 90mm.

 

 

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FALenses Technology specializes in providing machine vision core hardware. You can go to the official website of FALenses Technology at https://www.falenses.com/ for more information.

APPLICATION